High Precision LED X-ray AX9600 Unicomp Optoelectronics Manufacturing Tester
The UNICOMP AX9600 features a self-developed 160kV high-power open micro-focus X-ray tube, delivering an ultra-small 0.8μm focal spot. With exceptional magnification up to 2000 times and outstanding ray penetration capacity, it accurately measures void ratio of TVS diodes, and is ideal for high-precision quality inspection of advanced IC packaging, HBM memory chips and GPU semiconductor components.
Technical Specifications
| System Summary |
| Dimensions |
1690mm(L)×2116mm(W)×1880mm(H) |
| Weight |
4590kg |
| Power Supply |
220V±10% 50Hz/60Hz 9A |
| Power Consumption |
2kw |
| X-ray Tube |
| Tube Type |
Open Type |
| Voltage |
160kv |
| Max. Power |
64W |
| Focus Spot Size |
1µm |
| Imaging System |
| X-ray Detector |
FPD |
| Pixel Size |
84µm |
| Detection Area |
129*129mm |
| Pixel Matrix |
1536*1536[pixel] |
| Frame Rates |
Max 30fps |
| System Magnification |
34000X |
| Motion Control System |
| Max. Payload Size |
520*520[mm] |
| Max. Detection Size |
520*520[mm] |
| X/Y/Z-Axis Travel Distance |
550/710/265[mm] |
| Tilt and Rotation |
Detect XY±70° Tilt |
| Industrial PC |
| Motion Control Mode |
34"HD 4K curved display |
| Operating System |
Windows 11 64-bit |
| Storage |
4TB HDD+512G SSD |
| Memory |
32G |
| Processor |
i5 12 generation |
| Other Features |
| Door Operation |
Automatic Door |
| X-Ray Safety |
<1µSv/h |
Applications
The UNICOMP AX9600 high-power micro-focus X-ray inspection system is tailored for ultra-precision non-destructive testing of advanced semiconductor and electronic components. It excels in void ratio measurement of TVS diodes, internal defect detection of advanced IC packaging, HBM high-bandwidth memory chips, GPU modules and high-density electronic assemblies. Widely applied to quality inspection of automotive electronics, power semiconductors, aerospace electronic devices and precision micro-components, it enables accurate analysis of micro-voids, solder joint defects, internal cracks and assembly anomalies, supporting R&D verification and mass-production quality control for high-end semiconductor industries.
Inspection Images
Sample Inspection Image
Dimensions and Appearance
System Dimensions and Appearance
